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Beam Injection Assessment of Defects in Semiconductors (eBook)

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Autor: Martin (Hrsg.) Kittler

CHF 273.30

ISBN: 978-3-0357-0682-6

Einband: PDF

Verfügbarkeit: Download, sofort verfügbar (Link per E-Mail)

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Proceedings of the 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98), held in Parkhotel Schloss Wulkow near Berlin, Germany, August/September 1998

Autor	Kittler, Martin (Hrsg.) / Breitenstein, Otwin (Hrsg.) / Endrös, A. (Hrsg.) / Schröter, Wolfgang (Hrsg.)
Verlag	Trans Tech Publications
Einband	PDF
Erscheinungsjahr	1998
Seitenangabe	550 S.
Ausgabekennzeichen	Englisch

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